High Performance Memory Testing
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.\ High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design,...
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Dealing primarily with embedded memory, Adams (of IBM's Design-For- Test department) explains the design considerations of built-in memory self-test on computer chips that evaluates the correctness of memory outputs and the determination of defect rates. His discussion is based on the assumption that proper self test of memories involves the understanding of memory design equally as much as the understanding of memory test. Annotation (c)2003 Book News, Inc., Portland, OR
PrefaceSect. IDesign & Test of MemoriesCh. 1Opening Pandora's Box1Ch. 2Static Random Access Memories17Ch. 3Multi-Port Memories47Ch. 4Silicon On Insulator Memories57Ch. 5Content Addressable Memories67Ch. 6Dynamic Random Access Memories77Ch. 7Non-Volatile Memories89Sect. IIMemory TestingCh. 8Memory Faults103Ch. 9Memory Patterns127Sect. IIIMemory Self TestCh. 10BIST Concepts149Ch. 11State Machine BIST163Ch. 12Micro-Code BIST173Ch. 13BIST and Redundancy183Ch. 14Design For Test and BIST195Ch. 15Conclusions203App. AFurther Memory Fault Modeling207App. BFurther Memory Test Patterns213App. CState Machine HDL223References229Glossary / Acronyms241Index243About the Author247
