Logic Testing and Design for Testability

Paperback
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Author: Hideo Fujiwara

ISBN-10: 0262561999

ISBN-13: 9780262561990

Category: Electronics - Circuits - Logic

Today's computers must perform with increasing reliability, which in turn depends on the problem of determining whether a circuit has been manufactured properly or behaves correctly.\ However, the greater circuit density of VLSI circuits and systems has made testing more difficult and costly. This book notes that one solution is to develop faster and more efficient algorithms to generate test patterns or use design techniques to enhance testability - that is, "design for testability." Design...

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Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.