Nanoscale Phenomena in Ferroelectric Thin Films
Nanoscale Phenomena in Ferroelectric Thin Films presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It consists of two main parts: electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well-known leading experts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland,\ Korea) were invited to contribute to each chapter.
Search in google:
Eleven contributions present recent findings about the electrical characterization of nanoscale ferroelectic capacitors, and nano domain manipulation and visualization in ferroelectric materials. The aim of the experiments is to understand unexplained macroscopic phenomena and develop ferroelectric thin films that exhibit novel and improved physical and chemical properties due to their nanoscale size. Among the topics are the effect of ferroelectric film thickness and lateral size variation on the performance of capacitors, polarization switching and fatigue of ferroelectric thin films studies by piezoelectric force microscopy, domain switching and self-polarization in perovskite thin films, and scanning probe microscopy of ferroelectrics at MHz frequencies. Annotation ©2004 Book News, Inc., Portland, OR
List of ContributorsPrefaceAcknowledgmentITesting and characterization of ferroelectric thin film capacitorsIISize effects in ferroelectric film capacitors: role of the film thickness and capacitor sizeIIIFerroelectric thin films for memory applications: nanoscale characterization by scanning force microscopyIVNanoscale domain dynamics in ferroelectric thin filmsVPolarization switching and fatigue of ferroelectric thin films studied by PFMVIDomain switching and self-polarization in perovskite thin filmsVIIDynamic-contact electrostatic force microscopy and its application to ferroelectric domainVIIIPolarization and charge dynamics in ferroelectric materials with SPMIXNanoscale investigation of MOCVD-Pb(Zr,Ti)O[subscript 3] thin films using scanning probe microscopyXSPM measurements of ferroelectrics at MHz frequenciesXIApplication of ferroelectric domains in nanometer scale for high-density storage devices
