Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a...
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Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing Bibliography: over 700 entries
PrefaceAbout the AuthorsIIntroduction to Testing11Introduction32VLSI Testing Process and Test Equipment173Test Economics and Product Quality354Fault Modeling57IITest Methods815Logic and Fault Simulation836Testability Measures1297Combinational Circuit Test Generation1558Sequential Circuit Test Generation2119Memory Test25310DSP-Based Analog and Mixed-Signal Test30911Model-Based Analog and Mixed-Signal Test38512Delay Test41713IDDQ Test439IIIDesign and Testability46314Digital DFT and Scan Design46515Built-in Self-Test48916Boundary Scan Standard54917Analog Test Bus Standard57518System Test and Core-Based Design59519The Future of Testing613ACyclic Redundancy Code Theory615BPrimitive Polynomials of Degree 1 to 100619CBooks on Testing621Bibliography631Index671
