The Boundary-Scan Handbook
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with Ad-Hoc testing methods into well-structured problems that software can easily and...
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The first edition explained to professionals in the electronics industry the 1149.1 standard for testing, which was adopted by the IEEE in February 1990 and ratified as an ANSI standard later that year. This second edition updates the treatment to incorporate the emerging 1149.4 standards, the Boundary-Scan Description Language (BSDL) that the IEEE has made part of the standard, and the 1149.4 Mixed-Signal Test Bus accepted by the IEEE just before the text went to press. After reviewing the basics, vocabulary, structure and features of BSDL, Parker considers testing methods, advanced topics, designing for the test, and other topics. Annotation ©2003 Book News, Inc., Portland, OR
List of FiguresList of TablesList of Design-for-Test RulesPreface to the First EditionPreface to the Second EditionPreface to the Third EditionAcknowledgement1Boundary-Scan Basics and Vocabulary12Boundary-Scan Description Language (BSDL)493Boundary-Scan Testing1074Advanced Boundary-Scan Topics1495Design for Boundary-Scan Test1716Analog Measurement Basics2017IEEE 1149.4: Analog Boundary-Scan2258IEEE 1149.6: Testing Advanced I/O2679IEEE 1532: In-System Configuration319ABSDL Syntax Specifications345Bibliography357Index365
